The Preparation and Characterization of Silicon for Infrared Detectors: (1981)

Chapter: APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON

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Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 84 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 85 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 86 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 87 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 88 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 89 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 90 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 91 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 92 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 93 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 94 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 95 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 96 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 97 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 98 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 99 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 100 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 101 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 102 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 102
Page 103 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 104 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 105 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 106 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 107 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 107
Page 108 Cite Bookmark
Suggested Citation: "APPENDIX A: CHARACTERIZATION TECHNIQUES APPLICABLE TO HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Page 108
Next Chapter: APPENDIX B: WORKSHOP PARTICIPANTS
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