The Preparation and Characterization of Silicon for Infrared Detectors: (1981)

Chapter: CHARACTERIZATION OF HIGH-PURITY SILICON

Previous Chapter: DEVICE NEEDS
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 34
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 35
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 36
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 37
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 38
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 39
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 40
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 41
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 42
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 43
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 44
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
Page 45
Suggested Citation: "CHARACTERIZATION OF HIGH-PURITY SILICON." National Research Council. 1981. The Preparation and Characterization of Silicon for Infrared Detectors:. Washington, DC: The National Academies Press. doi: 10.17226/19661.
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Next Chapter: POLYCRYSTALLINE SILICON PREPARATION
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