Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure (2018)
Chapter: Appendix B: Single-Event Effects Testing Facilities in the United States
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Suggested Citation:
"Appendix B: Single-Event Effects Testing Facilities in the United States." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
B
Single-Event Effects Testing Facilities in the United States
TABLE B.1 Primary Locations for Single-Event Effects (SEEs) Testing in the United States and Canada
| Name of Facility | Location (City, State) | Energy (MeV/AMU) | Primary Goal(s) of Facility | Test in | Good for | Not Good for | Cost Per Hour | Number of Available Hours in a Year |
|---|---|---|---|---|---|---|---|---|
| Heavy Ions | ||||||||
| Texas A&M University Cyclotron Institute (TAMU) | College Station, Texas | 10, 25, 40 | Nuclear physics, radiation effects | Air | Most devices | Assemblies-stacked devices | $800–$1,200 | 3,500 |
| Lawrence Berkeley National Laboratory 88” Cyclotron (LBNL) | Berkeley, California | 4.5, 10, 16, 30 | Nuclear physics, radiation effects | Vacuum — limited air | Standard device packages and test structures | Highly packaged devices or extreme angle tests | ~$2,300 | 2,000–2,500 |
| Michigan University National Superconducting Cyclotron Lab (NSCL) | East Lansing, Michigan | 70–140 up to 170 | Nuclear physics, radiation effects | Air | Most devices and some assemblies | Stacked devices—similar thicknesses | $5,000 $4,000 | 0 |
| Brookhaven National Laboratory, Tandem Van de Graaff, Single-Event Upset Test Facility (SEUTF) | Upton, New York | <2 MeV for high Z up to 8 Mev for low Z | Nuclear physics, radiation effects | Vacuum only | Lower LET work or test structures | Power devices and complex integrated circuits | $1,250 $1,500 | <100 |
Suggested Citation:
"Appendix B: Single-Event Effects Testing Facilities in the United States." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
| Name of Facility | Location (City, State) | Energy (MeV/AMU) | Primary Goal(s) of Facility | Test in | Good for | Not Good for | Cost Per Hour | Number of Available Hours in a Year |
|---|---|---|---|---|---|---|---|---|
| Brookhaven National Laboratory, NASA Space Radiation Laboratory (NSRL) | Upton, New York | 50–1500 | NASA biology and shielding research | Air | All packaged devices, assemblies and extreme angle tests | Some dynamic operations—due to pulsed beam | $6,000 | 500, up to 1,500 |
| Medium-Energy Protons | ||||||||
| Brookhaven National Laboratory, Tandem Van de Graaff, Single-Event Upset Test Facility (SEUTF) | Upton, New York | <29 | Nuclear physics, radiation effects | Vacuum only | Low-energy proton SEU studies | Ineffective for revealing destructive SEE susceptibility | $1,250 | <100 |
| Crocker Nuclear Laboratory, UC-Davis (CNL) | Davis, California | 1–70 | Nuclear physics, radiation effects | Air | Displacement damage studies and determining low-medium energy proton SEU susceptibility | Ineffective for revealing destructive SEE susceptibility | $1,500 | 700 |
| Lawrence Berkeley National Laboratory 88” Cyclotron (LBNL) | Berkeley, California | 1–55 | Nuclear physics, radiation effects | Air | Displacement damage studies and determining low-medium energy proton SEU susceptibility | Ineffective for revealing destructive SEE susceptibility | $1,600–$1,775 | 2,000–2,500 |
| Texas A&M University Cyclotron Institute (TAMU) | College Station, Texas | 10, 25, 40, 50 | Nuclear physics, radiation effects | Air | Displacement damage studies and determining low-medium energy proton SEU susceptibility | Ineffective for revealing destructive SEE susceptibility | $800–$1,200 | 3,000+ |
| Brookhaven National Laboratory, NASA Space Radiation Laboratory (NSRL) | Upton, New York | 50–2,500 | NASA biology and shielding research | Air | All packaged devices, assemblies and extreme angle tests | Some dynamic operations—due to pulsed beam | $6,000 | 500, up to 1,500 |
Suggested Citation:
"Appendix B: Single-Event Effects Testing Facilities in the United States." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
| Name of Facility | Location (City, State) | Energy (MeV/AMU) | Primary Goal(s) of Facility | Test in | Good for | Not Good for | Cost Per Hour | Number of Available Hours in a Year |
|---|---|---|---|---|---|---|---|---|
| High-Energy Protons | ||||||||
| NASA Space Radiation Laboratory (NSRL) | Upton, New York | 50–2,500 | NASA biology and shielding research | Air | Not used for proton testing of electronics | Not used for proton testing of electronics | $6,000 | 500, up to 1,500 |
| Loma Linda Cancer Treatment Center | Loma Linda, California | 230 | Medical therapy, radiation effects | Air | Suitable for determining proton susceptibilities in most electronics | Not effective for revealing destructive SEE susceptibilities | Data not available | Data not available |
| Massachusetts General Hospital (MGH) | Boston, Massachusetts | 230 | Medical therapy, radiation effects | Air | Suitable for determining proton susceptibilities in most electronics | Not effective for revealing destructive SEE susceptibilities | $750 | 600–800 |
| Northwestern Medicine Chicago Proton Center | Warrenville, Illinois | 230 | Medical therapy, radiation effects | Air | Suitable for determining proton susceptibilities in most electronics | Not effective for revealing destructive SEE susceptibilities | $1,000 | 600–800 |
| TRIUMF | Vancouver, Canada | 70–500 | Nuclear physics, medical therapy, radiation effects | Air | Suitable for determining proton susceptibilities in most electronics | Not effective for revealing destructive SEE susceptibilities | Data not available | 500–1,000 |
NOTE: This table lists the facilities in the United States (and the TRIUMF facility in Canada) that are the primary locations for single-event effects (SEEs) testing. There are other facilities not listed here that are used for other types of radiation testing of electronics. LET, linear energy transfer; SEU, single-event upset.
SOURCE: Chuck Foster, “Radiation Effects Heavy Ion Research/Test Facilities in 2050,” briefing to the committee; J. George, “Update on the U.S. Space Radiation Test Infrastructure for Single-Event Effects,” briefing to the committee; Ken LaBel, “External Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single-Event Effects,” briefing to the committee.
Suggested Citation:
"Appendix B: Single-Event Effects Testing Facilities in the United States." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
Suggested Citation:
"Appendix B: Single-Event Effects Testing Facilities in the United States." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
Suggested Citation:
"Appendix B: Single-Event Effects Testing Facilities in the United States." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
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