Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure (2018)
Chapter: Appendix C: Acronyms
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Suggested Citation:
"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
C
Acronyms
| ADC | analog-to-digital converter |
| APL | approach, proximity, and landing |
| ASIC | application-specific integrated circuit |
| AU | astronomical unit |
| CAD | computer-aided design |
| CCD | charge-coupled device |
| CME | coronal mass ejection |
| CMOS | complementary metal–oxide–semiconductor |
| CMUXE | Center for Materials Under Extreme Environments |
| COTS | commercial off the shelf |
| CRADA | Cooperative Research and Development Agreement |
| DAC | digital-to-analog converter |
| DC | direct current |
| DDD | displacement damage dose |
| DOD | Department of Defense |
| DOE | Department of Energy |
| DRAM | dynamic random-access memory |
| DSEE | destructive single-event effect |
| ESA | European Space Agency |
| ESD | electrostatic discharge |
| ESP | Emission of Solar Protons |
| FDIR | fault detection, isolation, and recovery |
| FOM | figure of merit |
| FPGA | field-programmable gate array |
| FRIB | Facility for Rare Ion Beams |
Suggested Citation:
"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
| FY | fiscal year |
| GCR | galactic cosmic rays |
| GEO | geostationary orbit |
| GeV | gigaelectionvolt |
| GNC | guidance, navigation, and control |
| HA | hardness assurance |
| HZE | high (H) atomic number (Z) and energy (E) |
| IEEE | Institute of Electrical and Electronics Engineers |
| IoT | Internet of Things |
| ISS | International Space Station |
| IUCF | Indiana University Cyclotron Facility |
| JPL | Jet Propulsion Laboratory |
| LANL | Los Alamos National Laboratory |
| LBNL | Lawrence Berkeley National Laboratory |
| LED | light-emitting diode |
| LEO | low Earth orbit |
| LET | linear energy transfer |
| M&O | microelectronic and optoelectronic |
| M&S | modeling and simulation |
| MBMA | Model-Based Mission Assurance |
| MBSE | Model-Based Systems Engineering |
| MBU | multi-bit upset |
| MC | Monte Carlo |
| MCU | multi-cell upset |
| MeV | million electron volts |
| MIBL | Michigan Ion Beam Laboratory |
| MIT | Massachusetts Institute of Technology |
| MMOD | micrometeoroids and orbital debris |
| MOOC | massive open online course |
| MOSFET | metal-oxide-semiconductor field-effect transistor |
| MRED | Monte Carlo Radiative Energy Deposition |
| NASA | National Aeronautics and Space Administration |
| NEPP | NASA Electronic Parts and Packaging |
| NRL | Naval Research Laboratory |
| NSCL | National Superconducting Cyclotron Laboratory |
| NSREC | Nuclear and Space Radiation Effects Conference |
| NSRL | NASA Space Radiation Laboratory |
| NSRSS | NASA Space Radiation Summer School |
| ORSORT | Oak Ridge School of Reactor Technology |
| PSYCHIC | Prediction of Solar Particle Yields for Characterizing Integrated Circuits |
Suggested Citation:
"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
| RADECS | Radiation and its Effects on Components and Systems |
| RF | radio frequency |
| RPP | rectangular parallelepiped |
| SDRAM | synchronous dynamic random-access memory |
| SEB | single-event burnout |
| SEE | single-event effect |
| SEFI | single-event functional interrupt |
| SEGR | single-event gate rupture |
| SEL | single-event latchup |
| SEP | solar energetic particle |
| SET | single-event transient |
| SEU | single-event upset |
| SEUTF | Brookhaven SEU Test Facility |
| SMD | standard microcircuit drawing |
| SOA | safe operating area |
| SPE | solar particle event |
| SRAM | static random-access memory |
| TAMU | Texas A&M University |
| TID | total ionizing dose |
| UC | University of California |
Suggested Citation:
"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
Suggested Citation:
"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
Suggested Citation:
"Appendix C: Acronyms." National Academies of Sciences, Engineering, and Medicine. 2018. Testing at the Speed of Light: The State of U.S. Electronic Parts Space Radiation Testing Infrastructure. Washington, DC: The National Academies Press.
doi: 10.17226/24993.
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