Materials for High-Temperature Semiconductor Devices (1995)

Chapter: Conclusions and Recommendations

Previous Chapter: Device Testing for High-Temperature Electronic Materials
Suggested Citation: "Conclusions and Recommendations." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 65
Suggested Citation: "Conclusions and Recommendations." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 66
Suggested Citation: "Conclusions and Recommendations." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 67
Suggested Citation: "Conclusions and Recommendations." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 68
Suggested Citation: "Conclusions and Recommendations." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 69
Suggested Citation: "Conclusions and Recommendations." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 70
Next Chapter: References
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