Materials for High-Temperature Semiconductor Devices (1995)

Chapter: Device Testing for High-Temperature Electronic Materials

Previous Chapter: High-Temperature Electronic Packaging
Suggested Citation: "Device Testing for High-Temperature Electronic Materials." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
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Suggested Citation: "Device Testing for High-Temperature Electronic Materials." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 62
Suggested Citation: "Device Testing for High-Temperature Electronic Materials." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 63
Suggested Citation: "Device Testing for High-Temperature Electronic Materials." National Research Council. 1995. Materials for High-Temperature Semiconductor Devices. Washington, DC: The National Academies Press. doi: 10.17226/5023.
Page 64
Next Chapter: Conclusions and Recommendations
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